Dynamics of microparticles in vacuum breakdown: Cranberg's scenario updated by numerical modeling

作者:Seznec, B*; Dessante, Ph; Jager, T; Caillault, L; Teste, Ph; Minea, T
来源:Physical Review Accelerators and Beams, 2017, 20(7): 073501.
DOI:10.1103/PhysRevAccelBeams.20.073501

摘要

Microparticles (MP) and thermofield emission in vacuum are mainly caused by the roughness present at the surface of electrodes holding a high voltage. They can act as a trigger for breakdown, especially under high vacuum. This theoretical study discusses the interactions between one MP and the thermofield emission electron current as well as the consequences on the MP's transit. Starting from Cranberg's assumptions, new phenomena have been taken into account such as MP charge variation due to the secondary electron emission induced by energetic electron bombardment. Hence, the present model can be solved only numerically. Four scenarios have been identified based on the results, depending on the electron emission current from the cathode roughness (tip) and the size of the MP released at the anode, namely (i) one way; (ii) back and forth; (iii) oscillation; and (iv) vaporization. A crash study of the MP on the cathode shows that the electron emission can decrease if the MP covers the thermoemissive tip, i.e., if the MP is larger than the tip size-a phenomenon often called "conditioning"-and helping to increase the voltage holding in vacuum without breakdown.

  • 出版日期2017-7-24