Analysis of Reduced Graphene Oxides by X-ray Photoelectron Spectroscopy and Electrochemical Capacitance

作者：Koinuma Michio^*; Tateishi Hikaru; Hatakeyama Kazuto; Miyamoto Shinsuke; Ogata Chikako; Funatsu Asami; Taniguchi Takaaki; Matsumoto Yasumichi

来源：Chemistry Letters, 2013, 42(8): 924-926.

DOI：10.1246/cl.130152

Reduced graphene oxide (rGO) and reduced graphite oxide (rGtO) were analyzed by X-ray photoelectron spectroscopy. rGO and rGtO were prepared by photochemical, electrochemical, hydrazine-assisted, and thermal reduction of graphene oxide (GO) and graphite oxide (GtO). The number of CH defects increased for the photochemical and electrochemical reduction, whereas a direct increase in the number of C=C bonds was observed for thermal and hydrazine-assisted reduction. Cyclic voltammograms showed that the electrochemical capacitance of rGtO increased with the number of CH defects.

• 出版日期2013-8-5