科研之友
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摘要
Co2MnSi (CMS) thin films with different thickness were deposited on Si substrate and annealed at different temperatures to investigate the evolution of microstructure and magnetic properties. When T-a was fixed at 500 degrees C, due to the enhancement of B2-ordering, the increasing of CMS thickness to 100 nm will induce the increasing of M-s to 862 emu/cc. When CMS film thickness was fixed at 75 nm, the abnormal decrease of the Ms value from 782 emu/cc to 614 emu/cc were observed with increasing Ta to 700 degrees C which may be attributed to the intermixing between CMS layer and Ta layer.
- 出版日期2017-11-5
- 单位湖北大学
