Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs

作者：Huang Chun Po^*; Ting Hsin Wen; Chang Soon Jyh

来源：IEEE Transactions on Instrumentation and Measurement, 2016, 65(8): 1804-1817.

DOI：10.1109/TIM.2016.2562198

• Failure mode diagnosis
• successive approximation register (SAR) analog-to-digital converter (ADC)

This paper presents a comprehensive investigation of several important error sources for the successive-approximation register (SAR) analog-to-digital converters (ADCs). The error sources that we discuss in this paper include the dynamic comparator offset, the dynamic gain error of digital-to-analog converter (DAC), the capacitor mismatch of capacitive DAC, the incomplete settling of DAC, the undershoot of reference voltage, and the input signal coupling. The integral/differential nonlinearities (INL/DNL) of SAR ADCs that are resulted from these error sources are analyzed and addressed. A diagnostic procedure is presented to identify the possible error sources based on the INL/DNL plots. In addition, design suggestions for overcoming these problems are also offered and recommended in this paper.

• 出版日期2016-8