A Novel Differential Scan Attack on Advanced DFT Structures

作者：Da Rolt Jean^*; Di Natale Giorgio; Flottes Marie Lise; Rouzeyre Bruno

来源：ACM Transactions on Design Automation of Electronic Systems, 2013, 18(4): 58.

DOI：10.1145/2505014

• Security
• Scan-based DFT
• side-channel attacks

Scan chains insertion is the most common technique to ensure the testability of digital cores, providing high fault coverage. However, for ICs dealing with secret information, scan chains can be used as back doors for accessing secret data thus becoming a threat to system security. So far, advanced test structures used to reduce test costs (e. g., response compaction) and achieve high fault coverage (e. g., X's masking decoder) have been considered as intrinsic countermeasures against these threats. This work proposes a new generic scan-based attack demonstrating that these test structures are not sufficiently effective to prevent leakage through the test infrastructure. This generic attack can be easily adapted to several cryptographic implementations for both symmetric and public key algorithms. The proposed attack is demonstrated on several ciphers.

• 出版日期2013-10