X-Ray Photoelectron Spectroscopy - Methodology and Application

作者：Papis Polakowska E^*; White R G; Deeks C; Mann**erger M; Krajewska A; Strupinski W; Plocinski T; Jankowska O

来源：Acta Physica Polonica, A, 2014, 125(4): 1061-1064.

DOI：10.12693/APhysPolA.125.1061

The crucial measurements aspects of X-ray photoelectron spectroscopy, such as chemical state analysis, depth profiling, mapping, and thickness calculation have been presented. The metal alloys, Ti2O5, graphene and type-II InAs/GaSb superlattice structures have been examined by using the new Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer.

• 出版日期2014-4