科研之友
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摘要
A prototype instrument has been developed which allows the simultaneous acquisition of both X-ray diffraction and X-ray fluorescence data at a microscopic length scale for mapping studies on materials. The instrument takes full advantage of the performance of recently developed optics and detectors to optimize the detection of low-intensity signals with a monochromatic X-ray microbeam of 20 mu m diameter with a laboratory X-ray source.
- 出版日期2010-10
