摘要

Microstructures of CuI-Cu2MoO4 superionic conducting glasses have been studied by analytical transmission electron microscopy equipped with high angle annular detector dark field (HAADF) detector and energy dispersive X-ray spectroscopy (EDS). Structural inhomogeneities of 5-10 nm in size are observed from HAADF images in the glass. Deference of composition between bright and dark contrast regions is clearly confirmed by EDS experiments. The nanoscale phase separation of 5-10 nm in size has been clarified by HAADF and EDS experiments.

  • 出版日期2011-1-1

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