Effect of sputtered films on morphology of vertical aligned ZnO nanowires

作者：Kar J P; Lee S W; Lee W; Myoung J M^*

来源：Applied Surface Science, 2008, 254(20): 6677-6682.

DOI：10.1016/j.apsusc.2008.04.046

• ZnO
• nanowires
• thin films
• morphology

Vertical aligned ZnO nanowires were grown by MOCVD technique on silicon substrate using ZnO and AlN thin films as seed layers. The shape of nanostructures was greatly influenced by the under laying surface. Vertical nanopencils were observed on ZnO/Si, whereas the nanowires on both sapphire and AlN/Si substrate have the similar aspect ratio. XRD patterns suggest that the nanostructures have good crystallinity. High-resolution transmission electron microscopy (HRTEM) confirmed the single crystalline growth of the ZnO nanowires along [001] direction. Room-temperature photoluminescence (PL) spectra of ZnO nanowires on AlN/Si clearly show a band-edge luminescence accompanied with a visible emission. More interestingly, no visible emission for the nanopencils on ZnO/Si substrates, were observed.

• 出版日期2008-8-15