科研之友
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摘要
In the scanning electron microscope, weak secondary electron contrast between the alpha and beta phases of a Ti-6Al-4V alloy can be improved via imaging conditions such as beam voltage and current. Dual beam focussed ion beam-scanning electron microscopes are thereby suited for characterising micron and sub-micron microstructural features of Ti-6Al-4V in three dimensions via serial-sectioning procedures.
- 出版日期2011-4
