An Automated Test Equipment for Characterization o Emerging MRAM and RRAM Arrays

作者：Grossi Alessandro^*; Zambelli Cristian; Olivo Piero; Pellati Paolo; Ramponi Michele; Wenger Christian; Alvarez Herault Jeremy; Mackay Ken

来源：IEEE Transactions on Emerging Topics in Computing, 2018, 6(2): 269-277.

DOI：10.1109/TETC.2016.2585043

• Automated test equipment
• non-volatile memory
• reliability
• thermally assisted switching
• MRAM
• RRAM

In this paper it is presented a test equipment for the characterization of two different emerging memory technologies like the Thermally Assisted Switching-Magnetic Random Access Memory (TASMRAM) and the Resistive Random Access Memory (RRAM). The instrument is developed to allow a fast characterization of test array structures and can be potentially adapted for any other non-volatile memory generation. The hardware architecture is based on a PCI S5933 chipset being the local bus interface of a x86-PC that communicates with the units of the system like 14 bits/100 MHz arbitrary waveform generators and 12 bits/70 MHz programmable measurement units. A user-friendly software interface developed in LabVIEW has been implemented to allow large flexibility in changing the test parameters and a fast analysis of the test results. The instrument performance has been evaluated performing the typical non-volatile memory tests such as endurance and disturbs characterizations. running test flows up to 320 hours for MRAM devices and up to 6,137 hours for RRAM devices.

• 出版日期2018-6