Development of the Bunch Length Detector

作者：Kim Joon Yeon^*; Kim Do Gyun; Bhang Hyoung Chan; Yun Chong Cheoul; Kim Jong Won

来源：Journal of the Korean Physical Society, 2011, 59(2): 1617-1619.

DOI：10.3938/jkps.59.1617

• Bunch length
• Secondary electron
• RF deflector
• Microchannel plates

A bunch length detector is under construction to measure the time structure of a beam bunch based on the analysis of secondary electrons, which are produced by an ion beam hitting on a thin wire. The detector can measure the longitudinal beam shape possibly in a wide range of beam energy, intensity and ion species. A main component of the device is the rf deflector to deflect electrons in correlation with rf phase of the beam bunch. Its electromagnetic properties were analyzed using rf analysis programs, and a full-scale cold model was constructed and tested. A microchannel plate detector to measure electron currents was tested using a a-ray emitting source. With the tests of the components completed, the actual detector is being constructed based on the calculations of electron optics as well as from the test results.

• 出版日期2011-8-11