Molecular Depth Profiling with Cluster Secondary Ion Mass Spectrometry and Wedges

作者：Mao Dan; Wucher Andreas; Winograd Nicholas^*

来源：Analytical Chemistry, 2010, 82(1): 57-60.

DOI：10.1021/ac902313q

Secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by 40 keV C(60)(+) bombardment of a 395 nm thin film of Irganox 1010 doped with four delta layers of Irganox 3114. The wedge structure creates a laterally magnified cross section of the film. From an examination of the resulting surface, information about depth resolution, topography, and erosion rate can be obtained as a function of crater depth in a single experiment. This protocol provides a straightforward way to determine the parameters necessary to characterize molecular depth profiles and to obtain an accurate depth scale for erosion experiments.

• 出版日期2010-1-1