Multiple dependent state variable sampling plans with process loss consideration

作者：Aslam Muhammad^*; Yen Ching Ho; Chang Chia Hao; Jun Chi Hyuck

来源：International Journal of Advanced Manufacturing Technology, 2014, 71(5-8): 1337-1343.

DOI：10.1007/s00170-013-5574-9

• Multiple dependent state sampling
• Process loss
• Acceptable quality level
• Limiting quality level
• Vendor and buyer risks

In the literature, multiple dependent state variable sampling plans are available that does not constitute the process loss and hence are unable to distinguish among the product that falls within or outside specification limits. In this manuscript, the multiple dependent state variable sampling plans with process loss consideration are proposed. The designed parameters of the proposed plan are found by satisfying the vendor and buyer risks at various acceptable quality level and limiting quality level. The advantages of the proposed plan are discussed compared with the existing plans using the process loss Yen and Chang Commun Stat: Simul Comput 38:1579-1591, 2009) and Aslam et al. (Commun Stat-Theor Method 41:3633-3647, 2012). A real industrial example is included to illustrate the proposed plan.

• 出版日期2014-3