摘要

In this paper, quantum correction method has been used to study the quantum confinement effect in carbon nanotube field-effect transistor (CNTFET) instead of solving time consuming coupled Schrodinger-Poisson (SP) equation. The quantum confinement parameter, which depends on the oxide thickness and tube's diameter, is introduced to take care of quantum effect in the device. An analytical expression for quantum corrected potential is derived after solving Poisson equation under appropriate boundary conditions. A surface potential based compact and simple analytical expression has been proposed to calculate the quantum corrected concentration. The proposed surface potential model holds good for submicron devices in the inversion region. The threshold voltage shift due to quantum effect increases with scaling of oxide thickness, increase in channel concentration and tube's diameter. The simulated results of the proposed models show a good agreement with numerical results.

  • 出版日期2017-4