Analysis of Radiation-Induced Clock-Perturbation in Phase-Locked Loop

作者：Kim SinNyoung^*; Tsuchiya Akira; Onodera Hidetoshi

来源：IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, 2014, E97A(3): 768-776.

DOI：10.1587/transfun.E97.A.768

• radiation-hardened phase-locked loop (RH-PLL)
• soft error
• clock-perturbation model

This paper presents an analysis of radiation-induced clock-perturbation in phase-locked loop (PLL). Due to a trade-off between cost, performance, and reliability, radiation hardened PLL design need robust strategy. Thus, evaluation of radiation vulnerability is important to choose the robust strategy. The conventional evaluation-method is however based on brute-force analysis - SPICE simulation and experiment. The presented analysis result eliminates the brute-force analysis in evaluation of the radiation vulnerability. A set of equations enables to predict the radiation-induced clock-perturbation at the every sub-circuits. From a demonstration, the most vulnerable nodes have been found, which are validated using a PLL fabricated with 0.18 mu m CMOS process.

• 出版日期2014-3