摘要
We report a demonstration of a surface ion trap fabricated directly on a highly reflective mirror surface, which includes a secondary set of radio frequency (RF) electrodes allowing for translation of the quadrupole RF null location. We introduce a position-dependent photon scattering rate for a Yb-174(+) ion in the direction perpendicular to the trap surface using a standing wave of retroreflected light off the mirror surface directly below the trap. Using this setup, we demonstrate the capability of fine-tuning the RF trap location with nanometer scale precision and characterize the charging effects of the dielectric mirror surface upon exposure to ultra-violet light. Published by AIP Publishing.
- 出版日期2016-11-28