Development of spectrally selective imaging system for negative hydrogen ion source

作者：Ikeda K^*; Nakano H; Tsumori K; Kisaki M; Nagaoka K; Osakabe M; Takeiri Y; Kaneko O

来源：Review of Scientific Instruments, 2014, 85(2): 02A724.

DOI：10.1063/1.4842318

A spectrally selective imaging system has been developed to obtain a distribution of H a emissions at the extraction region in a hydrogen negative ion source. The diagnostic system consisted of an aspherical lens, optical filters, a fiber image conduit, and a charge coupled device detector was installed on the 1/3-scaled hydrogen negative ion source in the National Institute for Fusion Science. The center of sight line passes beside the plasma grid (PG) surface with the distance of 11 mm, and the viewing angle has coverage 35 mm from the PG surface. Two dimensional H a distribution in the range up to 20 mm from the PG surface was clearly observed. The reduction area for H a emission caused by beam extraction was widely distributed in the extraction region near the PG surface.

• 出版日期2014-2