摘要

Ag/SiO(2) Composite thin films were prepared by sol-gel method and UV radiation deoxydation, and were characterized by XRD, SEM, IR, UV-Vis,PL and Raman spectroscopy. The results of XRD indicate that the sample exhibits a typical face-centered cuble(fec) silver phase. The results of SEM show that the composite thin films are very homogeneous and the size of Ag and SiO(2) is small. The thickness of the films is about 1 mu m. The results of the optical absorption spectra show that the intensity of the absorption peaks at 420 nm is increasing with the molar ratio of Ag/Si, and the absorption peaks have some red shift. The PL spectra show that the luminescent intensity at 442 nm is very strong and decreases a little with the increase of n(Ag)/n(Si). And some blue shift appears. The results of Raman spectra indicate that the surface enhanced Raman scattering(SERS) appears due to the enhancement of the surface region electromagnetic field of Ag nanoparticles.