Limit on the Addressability of Fault-Tolerant Nanowire Decoders

作者：Chee Yeow Meng^*; Ling Alan C H

来源：IEEE Transactions on Computers, 2009, 58(1): 60-68.

DOI：10.1109/TC.2008.130

• EC/AUED codes
• fault tolerance
• nanowire crossbar
• nanowire decoder
• Sperner families

Although prone to fabrication error, the nanowire crossbar is a promising candidate component for next-generation nanometer-scale circuits. In the nanowire crossbar architecture, nanowires are addressed by controlling voltages on the mesowires. For area efficiency, we are interested in the maximum number of nanowires N(m, e) that can be addressed by m mesowires in the face of up to e fabrication errors. Asymptotically tight bounds on N(m, e) are established in this paper. In particular, it is shown that N(m, e) = Theta(2(m)/m(e 1/2)). Interesting observations are made on the equivalence between this problem and the problem of constructing optimal error-correcting and all unidirectional error-detecting (EC/AUED) codes, superimposed distance codes, pooling designs, and diffbounded set systems. Results in this paper also improve upon those in the EC/AUED code literature.

• 出版日期2009-1
• 单位南阳理工学院