Deuterium retention in single-crystal tungsten irradiated with 10-500 eV/D+

作者：Roszell J P; Davis J W^*; Alimov V Kh; Sugiyama K; Haasz A A

来源：Journal of Nuclear Materials, 2013, 438: S1084-S1087.

DOI：10.1016/j.jnucmat.2013.01.238

Deuterium retention in single-crystal tungsten was measured by thermal desorption spectroscopy as a function of D+ energy, fluence and specimen temperature. At 300 K, D retention increased significantly with increasing ion energy but at 500 K the energy dependence was weak. For both 300 and 500 K implantations, the retention was significantly lower for 10 eV/D+ than for 500 eV/D+ over the fluence range similar to 10(22)-10(24) D/m2. Depth profiles in D-implanted SCW show D retention at 300 K extending beyond 7 mu m while at 500 K retention concentration is detectable at the surface %26lt;60 nm. By comparison, D retention of 10 eV/D+ at both 300 and 500 K is detectable in the very near surface. Similar TDS release peaks for both 10 and 500 eV/D+ indicate that trapping mechanisms are independent of incident ion energy, and the reduced D retention is likely to be due to the shallower trapping depth.

• 出版日期2013-7