Development of Reference Shunt for Short-Time Alternating High Current Tests and Study of Measuring System

作者：Kida Junzo^*; Nakajima Masatoshi; Goda Yutaka; Kikuchi Kunio; Kudo Kietsu; Ishii Hiromi; Matsui Yoshihiko; Matsumura Toshiro; Kawamura Tatsuo

来源：Electrical Engineering in Japan, 2016, 197(2): 23-32.

DOI：10.1002/eej.22864

• short-time alternating current
• shunt
• comparison measurement
• uncertainty
• reference measuring system
• traceability

Short-circuit tests for power circuit breakers and others require alternative short-time current measurement, from a few kA to over several tens kA. However, the reference measurement system as a national standard or a specified secondary standard instrument to directly perform comparative test as a complete calibration test in high current class has not yet been established globally. The Japan Short-Circuit Testing Committee (hereinafter referred to as JSTC) has therefore developed a shunt resistor that can be used as a standard instrument for high current measurement. Reference system using this shunt resistor is also considered by JSTC. The performance of the newly developed shunt resistor has been checked through several methods, such as resistance measurement, high power current test, high frequency current test, temperature rise test, and interference test. The results of the tests proved satisfactory performance. Resistance of the shunt resistor before and after the tests was invariant and stable. This makes the shunt resistor adequate for a reference in practical use. In addition, evaluation of uncertainty of the whole reference system including this shunt resistor satisfactorily fulfills the requirements of IEC 62475 edition 1.0, 2010.

• 出版日期2016-11