Nanoscale characterization of beta-phase HxLi1-xNbO3 layers by piezoresponse force microscopy

作者：Manzo Michele^*; Denning Denise; Rodriguez Brian J; Gallo Katia

来源：Journal of Applied Physics, 2014, 116(6): 066815.

DOI：10.1063/1.4891352

We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d(33) coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 +/- 2% and 68 +/- 3% of the LiNbO3 value, for undoped and 5mol. % MgO-doped substrates, respectively.

• 出版日期2014-8-14