Determination and analysis of optical constants for Ge15Se60Bi25 thin films

作者：Atyia H E^*; Hegab Na

来源：Physica B: Condensed Matter , 2014, 454: 189-196.

DOI：10.1016/j.physb.2014.07.068

• Optical constants
• Approximate methods
• Accurate method
• Absorption edge
• Dielectric constants
• Relative errors

Thin films of Ge15Se60Bi25 were deposited, at room temperature, on glass substrates by thermal evaporation technique. The optical reflectance and transmittance of amorphous Ge15Se60Bi25 films were measured at normal incident in the wavelength range (500-2500 nm). The optical constants, the refractive index n and the absorption index k, were determined and analyzed according to different approximate methods using the transmittance measurements only and accurate method using the transmittance and reflectance measurements. Analysis of the absorption index k data reveal the values of the optical band gap E-g(opt), the width of tails E-e and the type of transitions. Some optical parameters such as, high frequency dielectric constant epsilon(infinity), dispersion parameters (oscillation energy E-s and the dispersion energy E-d), real and imaginary parts of complex dielectric constant (epsilon(1) and epsilon(2)) and dielectric parameters (dissipation factor tan delta, dielectric relaxation time tau, the volume and surface energy loss functions) were estimated by analyzing the refractive index n data.The relative errors for all optical parameters depending on different approximate methods were identified and discussed.

• 出版日期2014-12-1