A Practical Threshold Test Generation for Error Tolerant Application

作者：Ichihara Hideyuki^*; Sutoh Kenta; Yoshikawa Yuki; Inoue Tomoo

来源：IEICE Transactions on Information and Systems, 2010, E93D(10): 2776-2782.

DOI：10.1587/transinf.E93.D.2776

• acceptable fault
• test generation model
• error significance
• threshold testing and error tolerance

Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.

• 出版日期2010-10