Direct visualization method of the atomic structure of light and heavy atoms with double-detector C-s-corrected scanning transmission electron microscopy

作者：Kotaka Yasutoshi^*

来源：Applied Physics Letters, 2012, 101(13): 133107.

DOI：10.1063/1.4756783

The advent of C-s-corrected scanning transmission electron microscopy (STEM) has advanced the observation of atomic structures in materials and nanotechnology devices. High-angle annular dark-field (HAADF)-STEM using an annular detector visualizes heavy elements as bright spots at atomic resolution that can be observed with the Z-contrast technique. In this study, the atomic column of light elements is directly observed as bright spots by middle-angle bright-field (MABF)-STEM imaging. Therefore, a double-detector STEM imaging method was developed, exploiting the advantage of both MABF-STEM and HAADF-STEM to maximum, which consists of multiple exposures of simultaneously observed MABF- and HAADF-STEM images in red-green-blue color.

• 出版日期2012-9-24