A 10 V Josephson Voltage Standard Comparison Between NIST and INMETRO as a Link to BIPM

作者：Landim Regis Pinheiro^*; Tang Yi hua; Afonso Edson; Ferreira Vitor

来源：IEEE Transactions on Instrumentation and Measurement, 2011, 60(7): 2353-2358.

DOI：10.1109/TIM.2010.2099370

• Automation
• interlaboratory comparison
• Josephson arrays
• Josephson Voltage Standard (JVS)
• uncertainty

This paper describes a 10 V Josephson Voltage Standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the Instituto Nacional de Metrologia, Normalizacao e Qualidade Industrial (INMETRO) using automatic data acquisition. The results were in agreement to within 1.1 nV and the mean difference between the two JVSs at 10 V is 0.54 nV with a pooled combined standard uncertainty of 1.48 nV. Considering a recent JVS comparison between NIST and the Bureau International des Poids et Mesures (BIPM), the difference between INMETRO and the BIPM thus was found to be -0.26 nV with a standard uncertainty of 1.76 nV. INMETRO JVS improvements since the 2006 INMETRO-BIPM comparison are also described.

• 出版日期2011-7