Application of transmission electron microscopy and focused ion beam tomography for microstructure characterization of tungsten based materials

作者：Milc S^*; Kruk A; Cempura G; Penkalla H J; Thomser C; Czyrska Filemonowicz A

来源：Physica Scripta, 2011, T145: 014043.

DOI：10.1088/0031-8949/2011/T145/014043

Tungsten and its alloys are considered as structural materials for plasma-facing applications. The divertor design requires a material with a low ductile-brittle transition temperature and a recrystallization temperature (TR) of about 1570 K. One of the materials under consideration is W-1.7% TiC. The aim of this work was to perform a detailed microstructural characterization of the two materials, pure W and W-1.7% TiC alloy, by electron microscopy and a new technique, electron tomography. Thin foil preparation for transmission electron microscopy investigation of W-based materials is extremely difficult. After many trials by various techniques, a method for thin foil preparation was successfully elaborated and a transmission electron microscope (TEM) investigation was carried out. A pure tungsten specimen was investigated as a reference material. The application of TEM and focused ion beam-scanning electron microscopy techniques enables the identification of some creep-induced features in pure tungsten and the determination of the size and morphology of three-dimensional pores and particles in W-TiC-based alloy.

• 出版日期2011-12