摘要

Secondary ion mass spectrometry is applied to a wide range of Geoscience applications because of its capability to provide direct in situ measurement of elemental and isotopic composition. The CAMECA IMS 1280 and 1280-HR are large geometry ultra-high sensitivity ion microprobes that provide excellent precision and reproducibility for isotope ratio measurements. A precision at the tenth permil level is routinely achieved for the measurement of O-18/O-16 ratio from 10 mu m spots using multicollection Faraday Cups. However, analytical artifacts related to the surface topography and to the location of the analysis in the sample (X-Y effects) are known to bias the precision for isotope analysis. The X-Y effects have been investigated using a CAMECA prototype sample holder design. Results show a significant improvement in terms of reproducibility for analyses performed over a large area of the sample. Detailed analytical data using the new sample holder will be presented.

  • 出版日期2013-1

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