Applications of photoemission electron microscopy (PEEM) in magnetism research

作者:Scholl A*
来源:Current Opinion in Solid State & Materials Science, 2003, 7(1): 59-66.
DOI:10.1016/S1359-0286(03)00003-2

摘要

This paper reviews the application of X-ray photoemission electron microscopy (X-PEEM) to problems in modern magnetism. In particular. the ability to determine the magnetic domain structure of anti ferromagnetic thin films will be discussed. Published by Elsevier Science Ltd.

  • 出版日期2003-2