摘要
We use symmetry considerations to understand and unravel near-field measurements, ultimately showing that we can spatially map three distinct fields using only two detectors. As an example, we create 2D field maps of the outof-plane magnetic field and two in-plane fields for a silicon ridge waveguide. Furthermore, we are able to identify and remove polarization mixing of less than 1/30 of our experimental signals. Since symmetries are prevalent in nanophotonic structures and their near-fields, our method can have an impact on many future near-field measurements.
- 出版日期2014-5-1