Preparation and characterization of zirconium films for first mirror application in fusion devices

作者：Liu Wei; Wen Chengwei; Long Xinggui^*; Zhang Xiaohong; Liu Jinhua

来源：Fusion Engineering and Design, 2014, 89(11): 2755-2758.

DOI：10.1016/j.fusengdes.2014.07.023

• Nuclear materials
• Laser processing
• Zr
• Thin films
• Specular reflectivity

The nanostructured zirconium (Zr) films deposited on Al2O3 substrate are obtained by pulsed laser deposition (PLO) for the application of first mirror. Structural features, optical properties and surface morphologies of as-grown Zr films are systematically investigated as a function of pulse repetition rate. It is found that the Zr films show a typical hexagonal close packed structure and all deposited films exhibit a very smooth surface. There are no voids and folds on the surface of Zr films. The root mean square roughness (RMS) values increase with increasing pulse repetition rate. The variation of pulse repetition rate has no obvious effects on the reflectivity because of the smooth film surface. Up to the wavelength of 800 nm, the reflectivity is higher than 70%, which is excellent for the application of first mirror. 2014 Elsevier B.V.

• 出版日期2014-11
• 单位中国工程物理研究院; 中国工程物理研究院核物理与化学研究所