Analysis of High Voltage Dielectric Insulation Materials of XLPE by THz-TDS System

作者：Shi Wei^*; Yan Zhijin; Yang Lei; Dai Yang; Zhang Like; Bian Kangkang; Hou Lei

来源：International Conference on Frontiers in Optical Imaging Technology and Applications / International Symposium on Terahertz Technology and Applications / International Symposium on Surface Topography and Optical Microscopy, 2015 To 2015.

DOI：10.1117/12.2213823

• THz
• XLPE

In this paper, cross-linked polyethylene (XLPE) was analyzed by THz time domain spectroscopy (TDS) system at room temperature. By recording time domain signal of terahertz radiation field, frequency spectrum can be obtained by Fourier transform. Then the refractive index and dielectric constant in THz band are calculated. This proves that the THz-TDS system has a potential application for detecting the aging characteristic of XLPE.

• 出版日期2015
• 单位西安理工大学