A non-polarization short-wave-pass thin film edge filter

作者：YU Kan; ZHOU Xiao yang; WANG Jia qi; XU Jing jing; YIN Juan juan; Huazhong University of Science; Technology Wenhua College

来源：Optoelectronics Letters, 2014, 10(04): 247-249.

DOI：10.1007/s11801-014-4060-4

• cutoff
• matching
• transmittance
• stack
• dielectric
• bands
• oblique
• incidence
• separate
• refractive

Multilayer dielectric thin film edge filter has serious polarization sensitivity under oblique incidence. The cutoff-bands of the s-polarization and p-polarization light in conventional edge filter will separate obviously under 45° oblique incidence, which limits its application. Based on the two chosen materials TiO2 and SiO2, a novel stack structure is proposed to design the non-polarization short-wave-pass thin film edge filter. By using the(4H 4L 4H) as the matching layers, the polarization separation at 3 dB transmittance for the thin film edge filter cutoff-band is less than 1 nm at the incident angle of 45°. In this way, the non-polarization short-wave-pass edge filter is easily designed and fabricated.

• 出版日期2014-7-1
• 单位华中科技大学