摘要

This paper presents a digital background calibration technique to realize a linear voltage-controlled-oscillator ( VCO) based ADC. The distortion caused due to the VCO's nonlinear tuning characteristics is eliminated by introducing an inverse voltage-to-frequency transfer function in the signal path. The proposed calibration unit runs in the background and detects the inverse transfer function using a highly digital frequency locked loop. Like many other VCO-based ADCs, the proposed technique does not require analog building blocks such as operational amplifiers, multi-bit feed-back DACs etc., and retains the scaling friendly properties. Implemented in a 90 nm CMOS process, the on-chip calibration improves SNDR of an open-loop VCO-based ADC from 46 dB to more than 73 dB in 5 MHz signal bandwidth while consuming 4.1 mW power. The ADC achieves a figure-of-merit of 91-112 fJ/conv-step for different input frequencies.

  • 出版日期2014-4