摘要

The microstructures of beech wood and of beech wood-derived carbon, silicon carbide (SiC), and an aluminium/SiC composite were studied using both scanning electron microscopy (SEM) and synchrotron X-ray microcomputed tomography (mu CT). As opened to traditional two-dimensional imaging techniques, the mu CT data allowed nondestructive evaluation of relatively large sample volumes. Nondestructive three-dimensional data analysis led to the observation of microstructural features, such as varying pore-wall topographies not previously seen in SEM, calculations of the volume fraction of porosity and characterization of the interconnectivity of porosity in the SiC material.