科研之友
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摘要
The complex refractive index of CuxSe and Cu(In,Ga)Se-2 has been calculated from experimental data in the wavelength region from 0.3 to 20 mu m. For Cu(In,Ga)Se-2, the imaginary part exhibits very low values in the infrared range, whereas the real part decreases gently from 3 to 2.5. The Cu(xS)e film is found to be conducting with increasing real and imaginary parts. It is found not to follow the Drude model. Reflectance and transmittance measurements were performed on thin films grown on soda lime glass and double polished low-doped silicon as substrates. Solutions for the complex refractive index were extracted from the measurement data using an optical model for the film and substrate. A method to map all solutions for the complex refractive index was applied to select the physically correct one.
- 出版日期2012-3-21
