科研之友
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摘要
Tungsten (W) has been regarded as one of the most promising plasma facing materials (PFMs) in fusion reactors. The formation of bubbles and blisters during hydrogen (H) irradiation will affect the properties of W. The dependence of implantation conditions, such as fluence and energy, is therefore of great interest. In this work, polycrystalline tungsten samples were separated into two groups for study. The thick samples were implanted by 18keV H-3(+) ions to fluences of 1x10(18), 1x10(19) and 1x10(20) H+/cm(2), respectively. Another thick sample was also implanted by 80keV H-2(+) ions to a fluence of 2x10(17) H+/cm(2) for comparison. Moreover, the thin samples were implanted by 18keV H-3(+) ions to fluences of 9.38x10(16), 1.88x10(17) and 5.63x10(17) H+/cm(2), respectively. Focused ion beam (FIB) combined with scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were used for micro-structure analysis, while time-of-flight ion mass spectrometry (ToF-SIMS) was used to characterize the H depth profile. It is indicated that bubbles and blisters could form successively with increasing H+ fluence. H bubbles are formed at a fluence of approximate to 5.63x10(17) H+/cm(2), and H blisters are formed at approximate to 1x10(19) H+/cm(2) for 18keV H-3(+) implantation. On the other hand, 80keV H-2(+) ions can create more trapping sites in a shallow projected range, and thus enhancing the blisters formation with a relatively lower fluence of 2x10(17)H(+)/cm(2). The crack-like microstructures beneath the blisters are also observed and prefer to form on the deep side of the implanted range.
- 出版日期2018
- 单位兰州大学
