Dispersion measurement of tapered air-silica microstructure fiber by white-light interferometry

作者:Ye, QH*; Xu, C; Liu, X; Knox, WH; Yan, MF; Windeler, RS; Eggleton, B
来源:Applied Optics, 2002, 41(22): 4467-4470.
DOI:10.1364/AO.41.004467

摘要

Dispersion properties of novel, tapered, air-silica microstructure fibers are measured between 1.3 and 1.65 mum by white-light interferometry. Dispersion values (beta(2)) of -181 and -152 ps(2)/km were obtained for 2.2- and 3-mum core sizes, respectively, at lambda = 1.55 mum.