Alpha-Particle and Focused-Ion-Beam-Induced Single-Event Transient Measurements in a Bulk 65-nm CMOS Technology

作者：Gadlage Matthew J^*; Ahlbin Jonathan R; Bhuva Bharat L; Hooten Nicholas C; Dodds Nathaniel A; Reed Robert A; Massengill Lloyd W; Schrimpf Ronald D; Vizkelethy Gyorgy

来源：IEEE Transactions on Nuclear Science, 2011, 58(3): 1093-1097.

DOI：10.1109/TNS.2011.2112378

• Alpha particles
• heavy ions
• single-event transients
• soft error

Pulse widths of single-event transients produced by alpha particles in a 65-nm bulk CMOS technology are reported. The experimental setup and calibration of the alpha particle experiment is described in detail. A focused-ion beam is also utilized to explore how pulse broadening in the test circuit impacts the alpha particle SET measurements. The results of this work show that alpha particles are able to induce transient signals with a width of about 25 ps in this technology.

• 出版日期2011-6