Diode power detector X-parameters (TM) model extraction using LSNA-based measurement system

作者：Rodriguez Testera A^*; Mojon O; Boaventura A S; Fernandez Barciela M; Borges Carvalho N; Vanden Bossche M; Pailloncy G

来源：Electronics Letters, 2013, 49(3): 196-197.

DOI：10.1049/el.2012.3339

A study is presented on the problems that may arise when characterising low frequency device behaviour with a large signal network analyser (LSNA)-based measurement system. A diode power detector has been measured and, for the first time, an X-parameters based detector model was extracted from measurements. Difficulties measuring the detector output voltage dependence with baseband impedances, especially when those impedances showed resonant effects, were observed and a method to overcome the problems encountered is presented. The measurement-based detector X-parameters model demonstrated its usefulness to predict power detector behaviour under two-tone excitations and complex loads.

• 出版日期2013-1-31