Application of coincidence of reciprocal lattice point model to metal/sapphire hetero interfaces

作者：Montesa Christine Marie^*; Shibata Naoya; Tohei Tetsuya; Akiyama Kazuhiro; Kuromitsu Yoshirou; Ikuhara Yuichi

来源：Materials Science and Engineering B-Solid State Materials for Advanced Technology, 2010, 173(1-3): 234-238.

DOI：10.1016/j.mseb.2009.12.023

• Crystallographic orientation relationship
• Metal/sapphire interface
• Metal/ceramic interface
• CRLP
• Geometrical coherency
• Epitaxy

Coincidence of reciprocal lattice point (CRLP) model was used to predict the stable orientation relationships of metal/alpha-Al(2)O(3) hetero interfaces from geometrical considerations. The predicted stable orientation relationships (ORs) between various metals and alpha-Al(2)O(3) agreed well with the experimentally observed ORs at the hetero interfaces fabricated by film growth processes. In the bcc metal/alpha-Al(2)O(3) systems with different fabrication processes such as internal oxidation, Burgers and Pitsch-Schrader ORs were experimentally observed, which have not been predicted as the most stable orientation relationships by CRLP. However, these ORs are predicted in CRLP as secondary stable orientations.

• 出版日期2010-10-15