Dynamic X-ray direct conversion detector using a CdTe polycrystalline layer coupled to a CMOS readout chip

作者：Arques Marc; Renet Sebastien; Brambilla Andrea; Feuillet Guy; Gasse Adrien; Billon Pierron Nicolas; Jolliot Muriel; Mathieu Lydie; Rohr Pierre^*

来源：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , 2011, 633: S55-S58.

DOI：10.1016/j.nima.2010.06.120

• CdTe
• Close space sublimation
• CMOS
• X-ray

A direct detection X-ray imager is presented. It uses polycrystalline cadmium telluride (CdTe) grown by close space sublimation technique for the X-ray photoconductor. A 15 mm x 15 mm CdTe layer is connected to a 200 x 200 pixel readout CMOS by indium bumping. X-ray performance at 16 frames/s rate is measured. In particular a readout noise of 0.5 X-ray, an MTF of 50% at 4 lp/mm and a DQE of 20% at 4 lp/mm are obtained.

• 出版日期2011-5
• 单位中国地震局