A comparison of direct and iterative methods for determining traction-separation relations

作者：Gowrishankar Shravan; Mei Haixia; Liechti Kenneth M^*; Huang Rui

来源：International Journal of Fracture, 2012, 177(2): 109-128.

DOI：10.1007/s10704-012-9758-3

• Interface fracture
• Infrared crack opening interferometry
• Traction-separation relations
• Silicon/epoxy interface

Traction-separation relations have been used to represent the adhesive interactions at bimaterial interfaces for contact and fracture analyses. There are a variety of methods for determining these relations, which are broadly sorted into iterative and direct methods. Here we compare the traction-separation relations for a silicon/epoxy interface extracted by two such methods. Interferometric measurements of the normal crack opening displacements near the crack front in a double-cantilever beam specimen were exploited along with an augmented analytical solution for J-integral as an illustration of the direct method. As an example of the iterative method, we relied on comparisons of measured crack length and normal crack opening displacements with numerical simulations obtained from two types of candidate traction-separation relations. It was found that the shape of the traction-separation relation, in addition to the interfacial toughness and strength, was needed to bring the numerical solutions into optimal registration with the measurements. On the other hand, the direct method lived up to its name in terms of ease of parameter extraction while providing a reasonable set of parameters.

• 出版日期2012-10