摘要

Single-event transient (SET) in nanoscale integrated circuit (IC) is becoming more and more important with the feature size scaling, and the SET propagation in combinational circuit has became an important issue. In this work, a simple approach based on two-dimensional look-up table was proposed to characterize SET propagation in combinational circuit. The proposed approach is accurate and simple to calculate the variation of the SET pulse width in combinational circuit, by integrating pulse broadening and pulse quenching effects. Compared with Hspice simulation, the analysis error over Hspice is within 4%. The analytical results demonstrate that this approach can be used to calculate soft error rate (SER) in digital IC design.

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