High resolution extreme ultraviolet spectrometer for an electron beam ion trap

作者:Ohashi Hayato*; Yatsurugi Junji; Sakaue Hiroyuki A; Nakamura Nobuyuki
来源:Review of Scientific Instruments, 2011, 82(8): 083103.
DOI:10.1063/1.3618686

摘要

An extreme ultraviolet spectrometer has been developed for spectroscopic studies of highly charged ions with an electron beam ion trap. It has a slit-less configuration with a spherical varied-line-spacing grating that provides a flat focal plane for grazing incidence light. Alternative use of two different gratings enables us to cover the wavelength range 1-25 nm. Test observations with the Tokyo electron beam ion trap demonstrate the high performance of the present spectrometer such as a resolving power of above 1000.

  • 出版日期2011-8