An 8T Low-Voltage and Low-Leakage Half-Selection Disturb-Free SRAM Using Bulk-CMOS and FinFETs

作者：Pasandi Ghasem^*; Fakhraie Sied Mehdi

来源：IEEE Transactions on Electron Devices, 2014, 61(7): 2357-2363.

DOI：10.1109/TED.2014.2321295

• Bulk CMOS
• fin-shaped field effect transistor (FinFET)
• low power
• memory
• sense amplifier
• static random access memory (SRAM)
• subthreshold

In this paper, we present a new 8T design for static random access memory (SRAM) cell that is based on traditional Si technology and reduces leakage power considerably compared with a conventional design. Proposed design can be fully functional at smaller supply voltages over the conventional 6T SRAM cell. To verify the proposed design, a 32 kb SRAM is designed and simulated in 90 nm CMOS technology using the proposed 8T and conventional 6T SRAM cells. Operating at their VDDmin, simulations show improvement of 58% and 67% for write and read power per operation, respectively, for our design. To address the challenge of half-selection during write operation, a new low-power internal write-back scheme is presented. Finally, designing proposed cell using fin-shaped field effect transistors shows less sensitivity to variations and also improvement of 2.08x in read static noise margin at VDD = 1.0 V over bulk-CMOS-based SRAM cell.

• 出版日期2014-7