Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films

作者：Araujo E B^*; Nahime B O; Melo M; Dinelli F; Tantussi F; Baschieri P; Fuso F; Allegrini M

来源：Materials Research Bulletin, 2015, 61: 26-31.

DOI：10.1016/j.materresbull.2014.09.055

• Thin films
• Chemical synthesis
• Atomic force microscopy

Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale.

• 出版日期2015-1