Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images

作者：Yankovich Andrew B; Zhang Chenyu; Oh Albert; Slater Thomas J A; Azough Feridoon; Freer Robert; Haigh Sarah J; Willett Rebecca; Voyles Paul M^*

来源：Nanotechnology, 2016, 27(36): 364001.

DOI：10.1088/0957-4484/27/36/364001

• spectrum imaging
• nano characterization
• multivariate statistical analysis
• image denoising

Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.

• 出版日期2016-9-9