科研之友
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摘要
We present a comparative high-resolution electron energy-loss spectroscopy study on the interaction of atomic hydrogen and deuterium with various reconstructions of SiC(0 0 0 1). We first show that on both the (3 x 3) and (root 3 x root 3) R30 degrees reconstructions, deuterium atoms only bind to silicon atoms, thereby confirming the silicon-rich appellation of these reconstructions. Deuterium passivation of the (3 x 3) is only reversible when exposed to atomic deuterium at a surface temperature of 700K since tri- and dideuterides, necessary precursors for silicon etching, are not stable. On the other hand, we show that the deuteration of the (root 3 x root 3) R30 degrees is always reversible because precursors to silicon etching are scarce on the surface. Then, we demonstrate that hydrogen (deuterium) adsorption at 300K on both the (6 root 3 x 6 root 3) R30 degrees (buffer-layer) and the quasi-free-standing graphene occurs on carbon atoms justifying their carbon-rich appellation. Comparison of the deuterium binding in the intercalation layer of quasi-free-standing graphene with the deuterated (root 3 x root 3) R30 degrees surface provides some indication on the bonding structure at the substrate intercalation layer. Finally, by measuring C-H (C-D) vibrational frequencies and hydrogen (deuterium) desorption temperatures we suggest that partial sp(2)-to-sp(3) rehybridization occurs for the carbon atoms of the buffer-layer because of the corrugation related to covalent bonding to the SiC substrate. In contrast, on quasi-free-standing graphene hydrogen (deuterium) atoms adsorb similarly to what is observed on graphite, i.e. without preferential sticking related to the underlying SiC substrate.
- 出版日期2014-3-5
